Abstract

This project plays vital role in all type of communication applications. This project designs a novel low- transition linear feedback shift register (LFSR) that is based on some new observations about the output sequence of a conventional LFSR. Security of a hardware implementation can be compromised by a random fault or a deliberate attack. The traditional testing methods are good at detecting random faults, but they do not provide to secure all type of attacks. It requires a small set of deterministic tests to cover maximum percentage of single stuck-at faults. Thus, the test execution time is much shorter (at least two orders of magnitude). It has a higher resistance against stuck-at fault type of hardware Trojans. Further, this project can be extended to decrease power by using scan bit swapping LFSR. In this algorithm, all test patterns to circuit are generated using low power LFSR and, generated patterns are reordered, in such a way; power will be decreased while testing application. Latency reduction can be done by using scan chain reordering. Cell reordering plays vital role in transitions reduction to further improvement of timing constraint.

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